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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12656317 B1

PDFFull Text
Date of Patent:
Jun. 16, 2026

Filed:

Feb. 13, 2023

Nondestructive testing system and method using reflected shear horizontal guided waves

Applicant:

Ecole DE Technologie Superieure, Montréal, CA;

Inventors:

Pierre Belanger, Montreal, CA;

André Dionne, Montreal, CA;

Aurélien Thon, Montreal, CA;

Assignee:

ECOLE DE TECHNOLOGIE SUPERIEURE, Montreal, CA;

Attorney:

NORTON ROSE FULBRIGHT CANADA LLP

Primary Examiner:

Daniel S Larkin

Assistant Examiner:

Anthony W Megna Fuentes

Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01B 17/02 (2006.01); G01N 29/07 (2006.01); G01N 29/11 (2006.01); G01N 29/24 (2006.01); G01N 29/26 (2006.01); G01N 29/48 (2006.01);
U.S. Cl.
CPC ...
G01N 29/041 (2013.01); G01B 17/02 (2013.01); G01N 29/07 (2013.01); G01N 29/2412 (2013.01); G01N 2291/011 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/02854 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/106 (2013.01);
Abstract

A method and a system for nondestructive testing of a structure are provided. At least one ultrasonic probe is driven to cause at least one shear horizontal (SH) guided wave to propagate in the structure. At least one reflected guided wave signal is received from the structure to the at least one ultrasonic probe being driven. A comparison between an amplitude of the at least one reflected guided wave signal and an amplitude threshold is performed. A thickness of the structure is determined based on the comparison and a presence or an absence of at least one defect in the structure is detected based on the thickness as determined.

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Belanger, Pierre. (2026). Nondestructive testing system and method using reflected shear horizontal guided waves (U.S. Patent No. 12656317). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12656317

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