Odense, Denmark

Anders Runge Walther

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignees: King's College London, Syddansk Universitet. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anders Runge Walther. Retrieved from https://idiyas.com/inventor/anders-runge-walther

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Anders Runge Walther: Innovator in Optical Tomography

Introduction

Anders Runge Walther is an inventor based in Odense S, Denmark. He has made significant contributions to the field of optical tomography, particularly through his latest patent applications. Although he currently holds no granted patents, his work reflects a commitment to advancing imaging technologies.

Latest Patent Applications

One of his notable patent applications is for a "Raman Computed Tomography (Raman-CT) System and Method." This invention relates to an optical tomography scanning system designed for 3D imaging of objects, such as experimental rodents or patients, using Raman scattered light. The system includes a laser and an optical configuration for fixating the object, which is arranged for rotation. An optical receiving part captures the Raman scattered light, featuring a detector array that receives the light in two spatial dimensions. The light is then conveyed to a spectrometer, where multiple spectra are recorded for each relative rotational position of the object. This process enables 3D tomographic imaging, allowing for detailed reconstructions of the object being studied.

Conclusion

Anders Runge Walther's innovative work in optical tomography showcases his dedication to enhancing imaging techniques, despite not having any granted patents at this time. His contributions are poised to impact the field significantly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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