Solna, Sweden

Anders Edin

This inventor holds 1 USPTO granted patent. Top assignee: Okinawa Institute of Science and Technology Promotion Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anders Edin. Retrieved from https://idiyas.com/inventor/anders-edin-6tzu8rij

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Anders Edin: Innovator in Image Analysis

Introduction

Anders Edin is a notable inventor based in Solna, Sweden. He has made significant contributions to the field of image analysis, particularly in solving ill-posed inverse problems. His innovative approach has implications for various applications, including electron tomography.

Latest Patents

Anders Edin holds a patent titled "Iterated variational regularization combined with componentwise regularization." This invention provides a method for addressing challenges in image analysis by recovering the structure of a sample. The method involves several steps, including determining reliable prior knowledge, establishing an initial guess for the solution, and selecting a suitable regularization method.

Career Highlights

Anders Edin is associated with the Okinawa Institute of Science and Technology Promotion Corporation. His work focuses on advancing techniques in image analysis, contributing to the understanding and resolution of complex problems in this domain.

Collaborations

Anders has collaborated with esteemed colleagues such as Ozan Öktem and Hans Rullgàrd. Their combined expertise enhances the research and development efforts in the field of image analysis.

Conclusion

Anders Edin's contributions to image analysis through his innovative patent demonstrate his commitment to advancing technology in this area. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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