Munich, Germany

Andeas Nagy

This inventor holds 1 USPTO granted patent. Top assignee: Multitest Elektronische Systeme Gmbh. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andeas Nagy. Retrieved from https://idiyas.com/inventor/andeas-nagy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: The Innovations of Andeas Nagy

Introduction

Andeas Nagy is a notable inventor based in Munich, Germany. He has made significant contributions to the field of electronic component testing. His innovative approach has led to the development of a unique test apparatus that enhances the efficiency of testing electronic components.

Latest Patents

Andeas Nagy holds a patent for a "Test apparatus for the testing of electronic components." This invention features a slide-like contacting board supporting device that allows for the movement of the contacting board parallel to its plane. This design enables the contacting board to be positioned in various test positions, facilitating the testing of components that are arranged in strips.

Career Highlights

Nagy is currently employed at Multitest Elektronische Systeme GmbH, where he continues to innovate in the field of electronic testing. His work has been instrumental in advancing testing methodologies and improving the reliability of electronic components.

Collaborations

Andeas Nagy collaborates with talented coworkers, including Maximilian Schaule and Manuel Petermann. Their combined expertise contributes to the success of their projects and the advancement of technology in their field.

Conclusion

Andeas Nagy is a prominent figure in the realm of electronic component testing, with a patent that showcases his innovative spirit. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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