Rostow-on-Don, Russia

Anatoliy Panitch

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Endress+hauser Gmbh+co.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anatoliy Panitch. Retrieved from https://idiyas.com/inventor/anatoliy-panitch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2004

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2 patents (USPTO):Explore Patents

Title: The Innovations of Anatoliy Panitch

Introduction

Anatoliy Panitch is a notable inventor based in Rostow-on-Don, Russia. He has made significant contributions to the field of measurement instruments, holding a total of 2 patents. His work focuses on the development of sensor elements and their production methods.

Latest Patents

Anatoliy Panitch's latest patents include a "Method of producing sensor element - Electromechanical drive or sensor element for a measurement instrument" and a "Method for their production." These innovations reflect his expertise in creating advanced measurement technologies.

Career Highlights

Throughout his career, Panitch has worked with reputable companies such as Endress+Hauser GmbH & Co. and Endress + Hauser GmbH & Co. KG. His experience in these organizations has allowed him to refine his skills and contribute to various projects in the field of measurement technology.

Collaborations

Anatoliy has collaborated with talented individuals such as Sergej Lopatin and Igor Getman. These partnerships have further enhanced his innovative capabilities and have led to the development of cutting-edge technologies.

Conclusion

Anatoliy Panitch is a distinguished inventor whose work in sensor technology has made a lasting impact. His patents and collaborations demonstrate his commitment to advancing measurement instruments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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