San Francisco, CA, United States of America

Anath Raghavan

This inventor holds 1 USPTO granted patent. Top assignee: Digital Equipment Corporation. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anath Raghavan. Retrieved from https://idiyas.com/inventor/anath-raghavan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 73(Granted Patents)


Company Filing History:


Years Active: 1995

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Anath Raghavan and Faster Recovery for Atomic Database Transactions.

Introduction

Anath Raghavan is an inventor associated with San Francisco, California, and Digital Equipment Corporation. His patent work addresses how database systems can recover more quickly when a process fails during an atomic transaction.

Latest Patents

Raghavan is credited with 1 patent: “Method and System for Decreasing Recovery Time for Failed Atomic [Transactions].” The invention maintains global memory after process termination and uses control data structures to access database data. It records before-images of changes to those structures in a log held in global memory. If a process fails while an atomic transaction is updating the structures, the system restores the before-images, returning them to their consistent state from before the failure.

Career Highlights

Raghavan’s listed patent is associated with Digital Equipment Corporation. It focuses on reducing recovery time and preserving consistency in databases after process failures.

Collaborations

The provided information names T. K. Rengarajan and Peter M. Spiro as Raghavan’s coworkers. Their specific roles in the patent or related work are not stated.

Conclusion

Anath Raghavan’s patent describes a recovery approach that uses global memory and logged before-images to help restore database consistency after a process failure.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…