Austin, TX, United States of America

Anastasia Lynn Oshelski


Average Co-Inventor Count = 2.7

ph-index = 2

Forward Citations = 67(Granted Patents)


Company Filing History:


Years Active: 1996-2002

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2 patents (USPTO):Explore Patents

Title: Innovations by Anastasia Lynn Oshelski

Introduction

Anastasia Lynn Oshelski is a prominent inventor based in Austin, TX (US). She has made significant contributions to the field of semiconductor processing, holding 2 patents that showcase her innovative approach to technology.

Latest Patents

Her latest patents include a "Die-based in-fab process monitoring and analysis system for semiconductor processing." This method involves processing a workpiece through multiple steps while measuring characteristics at various stages. The results are displayed by overlaying the characteristics to present a final workpiece. Another notable patent is the "Automated data management system for analysis and control of photolithography steppers." This system enables the analysis and control of performance in submicron fabrication facilities, utilizing software on personal computers to manage data generated by photolithography steppers.

Career Highlights

Anastasia is currently employed at Advanced Micro Devices Corporation, where she continues to push the boundaries of semiconductor technology. Her work has been instrumental in enhancing the efficiency and effectiveness of semiconductor manufacturing processes.

Collaborations

Anastasia has collaborated with notable coworkers such as Greg Alan Goodwin and Paul W Ackmann, contributing to a dynamic and innovative work environment.

Conclusion

Anastasia Lynn Oshelski's contributions to semiconductor processing through her patents reflect her dedication to innovation and excellence in technology. Her work continues to influence the industry and inspire future advancements.

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