The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2002

Filed:

Apr. 13, 2000
Applicant:
Inventors:

Greg Goodwin, Austin, TX (US);

Anastasia Lynn Oshelski, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract

A method is provided for manufacturing, the method including processing a workpiece in a plurality of processing steps and measuring characteristics of the processing performed on the workpiece in at least two of the plurality of processing steps. The method also includes displaying the characteristics measured by overlaying the characteristics measured at each of the at least two of the plurality of processing steps to display a final resulting workpiece.


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