San Ramon, CA, United States of America

Ananta Vadlamani

This inventor holds 1 USPTO granted patent. Top assignee: Exabeam, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ananta Vadlamani. Retrieved from https://idiyas.com/inventor/ananta-vadlamani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ananta Vadlamani and Cybersecurity Detection Assessment.

Introduction

Ananta Vadlamani is an inventor based in San Ramon, California, and is associated with Exabeam, Inc. His patent work addresses how to evaluate whether a cybersecurity system can effectively meet a detection objective.

Latest Patents

Vadlamani is named on 1 patent: “System, Method, and Computer Program for Assessing a Cybersecurity System’s Ability to Satisfy a Detection Objective.” The invention describes a way to assess a detection objective by identifying the measures used to implement it and periodically calculating a score for each measure. These scores compare fields relevant to a measure with fields extracted by parsers during a defined time window. The system then combines the measure scores into an objective score that reflects the cybersecurity system’s operational effectiveness across the measures during that period.

Career Highlights

Vadlamani’s patent focuses on making cybersecurity detection performance measurable. By evaluating individual measures and combining their results, the disclosed system provides an assessment of how well a cybersecurity system satisfies a detection objective over time.

Collaborations

Vadlamani is associated with Exabeam, Inc. His listed coworkers include Adam Geller and Andrew Skrei.

Conclusion

Ananta Vadlamani’s patent describes a structured approach to assessing cybersecurity detection objectives through periodic measure-level scoring and an overall effectiveness score.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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