Mountain View, CA, United States of America

Anand J Bariya

This inventor holds 1 USPTO granted patent. Top assignee: National Semiconductor Corporation. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anand J Bariya. Retrieved from https://idiyas.com/inventor/anand-j-bariya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: The Innovations of Anand J Bariya

Introduction

Anand J Bariya is a notable inventor based in Mountain View, CA (US). He has made significant contributions to the field of photolithography through his innovative patent. His work is particularly recognized for its application in advanced semiconductor technologies.

Latest Patents

Anand J Bariya holds a patent for a Plasma Polymer Antireflective Coating. This antireflective coating is utilized in the photolithography process, where it is applied and removed in a plasma reactor. The halocarbon plasma polymer, specifically the fluorocarbon plasma polymer, provides an improved antireflective coating, enhancing the efficiency and effectiveness of the photolithography process.

Career Highlights

Anand J Bariya is associated with National Semiconductor Corporation, where he has contributed to various projects and innovations. His expertise in plasma polymer technology has positioned him as a valuable asset in the semiconductor industry.

Collaborations

Some of his notable coworkers include Kevin Carl Brown and Satyendra S Sethi. Their collaborative efforts have further advanced the research and development in their respective fields.

Conclusion

Anand J Bariya's contributions to the field of photolithography through his innovative patent demonstrate his commitment to advancing technology in the semiconductor industry. His work continues to influence the development of more efficient manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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