Lancaster, CA, United States of America

Amy Yuan Masem

This inventor holds 1 USPTO granted patent. Top assignee: Lockheed Martin Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Amy Yuan Masem. Retrieved from https://idiyas.com/inventor/amy-yuan-masem

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Amy Yuan Masem: Innovator in Wireless Measurement Systems

Introduction

Amy Yuan Masem is a prominent inventor based in Lancaster, CA (US). She has made significant contributions to the field of wireless measurement systems, showcasing her innovative spirit and technical expertise.

Latest Patents

Amy holds a patent for "Systems and methods for a charging cart of a wireless harness automated measurement system." This invention includes an apparatus designed to charge a wireless harness automated measurement system (WHAMS). The charging cart is equipped with a mobile frame, a plurality of light-emitting diode (LED) indicators, and multiple charging slots. This system allows for the efficient charging of wireless test modules (WTMs) while providing real-time status updates through the LED indicators.

Career Highlights

Amy is currently employed at Lockheed Martin Corporation, where she continues to develop innovative solutions in her field. Her work has been instrumental in advancing technologies that enhance measurement systems and improve operational efficiency.

Collaborations

Amy has collaborated with notable colleagues, including John Daniel Semmens and John Foster Braddy, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Amy Yuan Masem exemplifies the spirit of innovation through her work in wireless measurement systems. Her contributions not only advance technology but also inspire future generations of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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