Company Filing History:
Years Active: 2023
Title: Amrit Poudel: Innovator in Semiconductor Inspection Technology
Introduction
Amrit Poudel is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of semiconductor inspection technology. His innovative work has led to the development of a unique patent that addresses critical challenges in the industry.
Latest Patents
Amrit Poudel holds a patent for "Multimode defect classification in semiconductor inspection." This invention involves a semiconductor-inspection tool that scans a semiconductor die using multiple optical modes. The tool identifies various defects on the semiconductor die based on the scanning results. The scanning process generates multi-dimensional data based on pixel intensity for respective pixel sets, where each dimension corresponds to a distinct optical mode. A discriminant function is applied to transform this multi-dimensional data into respective scores, allowing for the classification of defects into distinct categories.
Career Highlights
Amrit Poudel is currently employed at Kla Corporation, where he continues to advance semiconductor inspection technologies. His work has been instrumental in enhancing the accuracy and efficiency of defect classification in semiconductor manufacturing processes.
Collaborations
Amrit collaborates with talented colleagues, including Vaibhav Gaind and Grace H Chen, who contribute to the innovative environment at Kla Corporation.
Conclusion
Amrit Poudel's contributions to semiconductor inspection technology exemplify the impact of innovation in the field. His patent reflects a commitment to improving manufacturing processes and ensuring higher quality standards in semiconductor production.