Zefat, Israel

Amnon Menachem


Average Co-Inventor Count = 3.0

ph-index = 1


Location History:

  • Nof Kineret Zefat, IL (2013)
  • Zefat, IL (2015)

Company Filing History:


Years Active: 2013-2025

Loading Chart...
3 patents (USPTO):Explore Patents

Title: Amnon Menachem: Innovator in Illumination Technology

Introduction

Amnon Menachem is a notable inventor based in Zefat, Israel. He has made significant contributions to the field of illumination technology, holding a total of 3 patents. His work focuses on advanced methods of illumination that enhance the inspection processes in various applications.

Latest Patents

Menachem's latest patents include innovative technologies such as "Dark field illumination based on laser illuminated phosphor." This patent describes an illumination module that incorporates a laser diode array to emit laser radiation, a phosphor illumination unit that generates phosphor radiation, and a multiple-angle illumination unit designed to dark field illuminate a sample wafer during inspection. Another significant patent is the "Advanced inspection method utilizing short pulses LED illumination," which details an illumination module featuring a LED driver and a group of light-emitting diodes (LEDs) that emit light pulses in response to high current short duration driving signals.

Career Highlights

Amnon Menachem is currently associated with Camtek Ltd., a company known for its innovative solutions in the field of inspection and metrology. His work at Camtek has positioned him as a key player in the development of advanced illumination technologies.

Collaborations

Throughout his career, Menachem has collaborated with talented individuals such as Yossi Cherbis and Arnon Ben Natan. These collaborations have contributed to the successful development of his patented technologies.

Conclusion

Amnon Menachem's contributions to illumination technology through his patents and work at Camtek Ltd. highlight his role as an influential inventor in the field. His innovative approaches continue to advance the capabilities of inspection technologies.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…