Mayfield Heights, OH, United States of America

Amit Sharma

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Viewray Technologies, Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Amit Sharma. Retrieved from https://idiyas.com/inventor/amit-sharma-ip315kup

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations by Inventor Amit Sharma

Introduction

Amit Sharma is a notable inventor based in Mayfield Heights, OH (US). He has made significant contributions to the field of radiation technology, particularly through his innovative patent.

Latest Patents

Amit Sharma holds a patent for "Radiation beam collimating systems and methods." This invention features a collimating system designed for collimating a radiation beam. It includes a first multileaf collimator and a second multileaf collimator, configured so that the radiation beam passes through the first collimator before reaching the second. The leaves of both collimators can move independently, enhancing the precision of radiation delivery to its target. He has 1 patent to his name.

Career Highlights

Amit Sharma is currently employed at Viewray Technologies, Inc., where he continues to develop innovative solutions in radiation therapy. His work focuses on improving the accuracy and effectiveness of radiation treatments for patients.

Collaborations

Some of his notable coworkers include Iwan Kawrykow and James F Dempsey, who contribute to the collaborative environment at Viewray Technologies, Inc.

Conclusion

Amit Sharma's contributions to radiation technology through his innovative patent demonstrate his commitment to advancing medical technology. His work continues to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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