Knoxville, TN, United States of America

Amir Ziabari

USPTO Granted Patents = 1 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Amir Ziabari: Innovator in Computed Tomography

Introduction

Amir Ziabari is a notable inventor based in Knoxville, TN (US). He has made significant contributions to the field of nondestructive evaluation (NDE) through his innovative patent. His work focuses on improving the quality of computed tomography (CT) reconstructions, which is crucial for detecting defects in various objects.

Latest Patents

Amir Ziabari holds a patent titled "System and method for artifact reduction of computed tomography reconstruction leveraging artificial intelligence and a priori known model for the object of interest." This patent addresses the challenges posed by artifacts in CT imaging, particularly beam-hardening artifacts that complicate defect detection. By utilizing computer-aided design (CAD) models and deep neural networks, his invention enhances the quality of CT reconstructions, leading to better defect detection compared to existing methods. He has 1 patent to his name.

Career Highlights

Amir Ziabari is associated with UT-Battelle, Inc., where he applies his expertise in artificial intelligence and CT technology. His work has been instrumental in advancing the capabilities of nondestructive evaluation techniques, making significant strides in the field.

Collaborations

Throughout his career, Amir has collaborated with esteemed colleagues, including Singanallur Venkatakrishnan and Philip R. Bingham. These collaborations have further enriched his research and development efforts in the realm of computed tomography.

Conclusion

Amir Ziabari's innovative contributions to computed tomography and nondestructive evaluation highlight his role as a leading inventor in the field. His patent demonstrates the potential of artificial intelligence in enhancing imaging techniques, paving the way for improved defect detection and characterization.

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