The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Aug. 03, 2021
Ut-battelle, Llc, Oak Ridge, TN (US);
Amir Ziabari, Knoxville, TN (US);
Singanallur Venkatakrishnan, Knoxville, TN (US);
Philip R. Bingham, Knoxville, TN (US);
Michael M. Kirka, Knoxville, TN (US);
Vincent C. Paquit, Knoxville, TN (US);
Ryan R. Dehoff, Knoxville, TN (US);
Abhishek Dubey, Rockville, MD (US);
UT-Battelle, LLC, Oak Ridge, TN (US);
Abstract
Nondestructive evaluation (NDE) of objects can elucidate impacts of various process parameters and qualification of the object. Computed tomography (CT) enables rapid NDE and characterization of objects. However, CT presents challenges because of artifacts produced by standard reconstruction algorithms. Beam-hardening artifacts especially complicate and adversely impact the process of detecting defects. By leveraging computer-aided design (CAD) models, CT simulations, and a deep-neutral network high-quality CT reconstructions that are affected by noise and beam-hardening can be simulated and used to improve reconstructions. The systems and methods of the present disclosure can significantly improve the reconstruction quality, thereby enabling better detection of defects compared with the state of the art.