Fremont, CA, United States of America

Amir Shalit

This inventor holds 1 USPTO granted patent. Top assignee: Mylex Corporation. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Amir Shalit. Retrieved from https://idiyas.com/inventor/amir-shalit-itvsmwkv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 29(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Amir Shalit: Innovator in Data Integrity Solutions

Introduction

Amir Shalit is a notable inventor based in Fremont, California. He has made significant contributions to the field of data integrity, particularly in the context of RAID (Redundant Array of Independent Disks) systems. His innovative approach addresses critical challenges in data preservation during dynamic changes in RAID configurations.

Latest Patents

Amir Shalit holds a patent for a method titled "Fault-tolerant preservation of data integrity during dynamic RAID set." This invention provides a method and apparatus for dynamically expanding an N drive RAID set to an M drive RAID set while ensuring data integrity. The process involves identifying a destructive zone in the N drive RAID set, mirroring the destructive zone data, and expanding the RAID set without compromising data integrity. He has 1 patent to his name.

Career Highlights

Amir Shalit is associated with Mylex Corporation, where he applies his expertise in data storage solutions. His work focuses on enhancing the reliability and efficiency of data management systems. His innovative contributions have positioned him as a key figure in the technology sector.

Conclusion

Amir Shalit exemplifies the spirit of innovation in the realm of data integrity solutions. His patent reflects a commitment to advancing technology and ensuring data reliability in dynamic environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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