This inventor holds 1 USPTO granted patent. Top assignee: Emc Corporation. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: **Amir H K Moghadam: Innovating Pattern Queries in N-Dimensional Datasets**
Introduction
Amir H K Moghadam, based in Rio de Janeiro, Brazil, is a notable inventor in the field of data analysis and pattern recognition. He holds a patent that addresses the challenges of evaluating pattern queries over large N-dimensional datasets, providing advanced methods for identifying features of interest.
Latest Patents
Moghadam's prominent patent, titled “Methods and apparatus for parallel evaluation of pattern queries over large N-dimensional datasets to identify features of interest,” presents innovative techniques for similarity-based pattern matching tasks. This patent outlines a system for executing pattern queries in parallel, which helps in efficiently processing large data sets. The method involves defining a distance metric to evaluate the closeness of N-dimensional bodies formed by pattern queries and candidate solutions, taking various criteria into account, and executing multiple instances of algebraic operators to score these solutions.
Career Highlights
Amir H K Moghadam is currently associated with EMC Corporation, where he contributes his expertise in data analysis and patent development. His work emphasizes enhancing the efficiency and accuracy of evaluating complex datasets, which is crucial in numerous high-tech applications.
Collaborations
Throughout his career, Moghadam has collaborated with talented individuals such as Angelo E M Ciarlini and Fabio A M Porto. These partnerships indicate his commitment to teamwork and innovation within his field, fostering an environment of shared knowledge and technological advancement.
Conclusion
Amir H K Moghadam's contributions through his patent and collaborations highlight his role as an innovator in the field of data analysis. His work has the potential to significantly advance how pattern queries are evaluated, paving the way for further technological innovations in data processing and analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
