Ramat Gan, Israel

Amir A Yaakobi

This inventor holds 1 USPTO granted patent. Top assignee: Algotec Systems Ltd.. Active years: 2015.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Amir A Yaakobi: Innovator in Three-Dimensional Image Segmentation

Introduction

Amir A Yaakobi is a notable inventor based in Ramat Gan, Israel. He has made significant contributions to the field of image processing, particularly in three-dimensional image segmentation. His innovative approach to error correction in segmented image data has garnered attention in the technological community.

Latest Patents

Amir A Yaakobi holds a patent for a method and systems for error correction for three-dimensional image segmentation. This patent describes a method that includes receiving segmented three-dimensional image data, which is divided into multiple slices. The process involves correcting at least one contour of the segmented data on at least one slice based on user commands, resulting in a corrected contour. Furthermore, the method automatically interpolates the correction represented by the corrected contour across multiple slices of the segmented image data. He has 1 patent to his name.

Career Highlights

Yaakobi is associated with Algotec Systems Ltd., where he applies his expertise in image processing technologies. His work at Algotec has positioned him as a key player in developing advanced solutions for image segmentation and error correction.

Collaborations

Amir has collaborated with notable colleagues, including Guy E Engelhard and Oranit Dror. These partnerships have contributed to the advancement of innovative technologies in their field.

Conclusion

Amir A Yaakobi's contributions to three-dimensional image segmentation through his patented methods highlight his role as an influential inventor. His work continues to impact the field of image processing significantly.

Profile summary based on public USPTO records.
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