Amir A Ghazanfarian

Title: Innovations by Amir A. Ghazanfarian: Pioneering Detection Systems at Stanford

Introduction

Amir A. Ghazanfarian, based in Stanford, CA, is a noteworthy inventor in the field of alignment detection systems. With a focus on improving substrate alignment techniques, his work is making significant contributions to both academic and practical applications.

Latest Patents

Ghazanfarian holds a patent for "Systems, methods and computer program products for detecting a position of a new alignment mark on a substrate." This innovative approach involves producing an alignment signal model from sample alignment signals to effectively fit new alignment signals. Remarkably, the alignment signal model can be derived using singular value decomposition, incorporating asymmetries from sample alignment marks and the coatings applied on them.

Career Highlights

Amir is currently affiliated with Leland Stanford Junior University, where he engages in research and development activities related to his patented technologies. His contributions focus on enhancing the precision and reliability of alignment detection, which is vital in various industrial applications.

Collaborations

Throughout his career, Ghazanfarian has collaborated with skilled professionals, including Xun Chen and Mark A. McCord. These partnerships reflect a commitment to advancing technology through teamwork and shared expertise.

Conclusion

As an influential inventor, Amir A. Ghazanfarian is at the forefront of innovation in alignment detection methodologies. His patent represents a significant leap in the field, promising to enhance the efficiency of processes that rely on precise alignment in various applications.