Essey-Les-Nancy, France

Amico Settefrati

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Arcelormittal. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Amico Settefrati. Retrieved from https://idiyas.com/inventor/amico-settefrati

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Amico Settefrati: Inventor in Metal-Coating Technology.

Introduction

Amico Settefrati is an inventor associated with ArcelorMittal and based in Essey-Les-Nancy, France. His recorded patent concerns equipment and methods for continuously dip-coating a metal strip.

Latest Patents

Settefrati is credited with 1 patent: “Apparatus and Method for Dip Coating a Metal Strip Using a Moveable Overflow.” The invention describes equipment for continuous hot-dip coating, including an annealing furnace, a tank containing a liquid metal bath, and a snout that guides the strip through a protective atmosphere into the bath. The snout tip is at least partly immersed to form a liquid seal. A movable support system carries an overflow connected by connecting means, with at least one vat and one pump.

Career Highlights

The available information links Settefrati’s patent work to ArcelorMittal and to industrial processes for coating metallic strips. The patent focuses on a movable overflow arrangement within continuous hot-dip-coating equipment.

Collaborations

His listed coworkers include Freddy Kreps and Hubert Saint-Raymond. The available details do not specify their roles in the patent or their particular contributions.

Conclusion

Amico Settefrati’s recorded invention addresses equipment for continuous hot-dip coating, with a movable overflow system designed for use in metal-strip processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…