Amardeep Sharma

Title: Amardeep Sharma and Machine-Learning Evaluation for Detecting Feature Bias.

Introduction

Amardeep Sharma is an inventor associated with Uttar Pradesh, India, and Optum, Inc. His patent work addresses the evaluation of machine-learning models for potential feature bias.

Latest Patents

Sharma is associated with 1 patent: “Machine learning evaluation for detecting feature bias.” The invention describes an evaluation framework that uses evaluation data structures to assess feature bias in machine-learning models. It receives an evaluation dataset containing different feature classes, generates at least two performance metrics, and uses those metrics and their average to calculate a unitless dissimilarity metric. This metric reflects variability associated with the evaluation feature.

Career Highlights

The disclosed invention focuses on making feature-bias evaluation more systematic by combining model-performance measurements into a unitless metric. Sharma is associated with Optum, Inc., a company working in the health services sector.

Collaborations

Rahul Pathak is identified as Sharma’s coworker. The available information does not specify the nature of their collaboration on the patent.

Conclusion

Amardeep Sharma’s patent describes a structured approach to identifying feature bias through performance metrics and a unitless dissimilarity measure.