This inventor holds 1 USPTO granted patent. Top assignee: Nanosys, Inc.. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Amanda Carpenter - Innovator in Optical Measurement Technology
Introduction
Amanda Carpenter is a notable inventor based in Sunnyvale, CA (US). She has made significant contributions to the field of optical measurement, particularly in the measurement of thin films. Her innovative work has led to the development of a patented technology that enhances the understanding of optical properties in various applications.
Latest Patents
Amanda holds a patent for her invention titled "Optical measurement of thin films." This patent describes embodiments of a measurement apparatus designed for measuring the optical properties of a sample film. The apparatus includes a first stage with an optical source and a block of transparent material that supports the sample film. The second stage features multiple layers and an optical detector, while an arm structure allows for the translation of the second stage with respect to the first stage. This invention is crucial for advancing optical measurement techniques.
Career Highlights
Amanda Carpenter is currently employed at Nanosys, Inc., where she continues to innovate and contribute to the field of optical technologies. Her work at Nanosys has positioned her as a key player in the development of advanced measurement systems.
Collaborations
Throughout her career, Amanda has collaborated with talented individuals such as Robert E. Wilson and Alexander Puski. These collaborations have fostered a creative environment that encourages the exchange of ideas and the advancement of technology.
Conclusion
Amanda Carpenter is a pioneering inventor whose work in optical measurement technology has made a significant impact in her field. Her patented invention demonstrates her commitment to innovation and excellence in optical properties measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
