Milan, Italy

Alvise Gangarossa

This inventor holds 8 USPTO granted patents. Top assignee: Pfu Limited. Active years: 2011-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alvise Gangarossa. Retrieved from https://idiyas.com/inventor/alvise-gangarossa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.7

ph-index = 6

Forward Citations = 127(Granted Patents)


Company Filing History:


Years Active: 2011-2014

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8 patents (USPTO):Explore Patents

Title: Alvise Gangarossa: Innovator in Scanning Technology

Introduction

Alvise Gangarossa is a prominent inventor based in Milan, Italy. He has made significant contributions to the field of scanning technology, holding a total of 8 patents. His work has been instrumental in advancing the capabilities of scanning devices, making them more efficient and effective.

Latest Patents

One of his latest innovations is a state-of-the-art scanner that enhances the functionality and performance of traditional scanning devices. This invention showcases his commitment to improving technology and meeting the needs of users in various industries.

Career Highlights

Alvise Gangarossa has built a successful career at Pfu Limited, where he continues to develop innovative solutions in scanning technology. His expertise and dedication have earned him recognition in the field, and he remains a key figure in driving advancements in this area.

Collaborations

Throughout his career, Alvise has collaborated with talented individuals such as Toshiki Satoji and Satoshi Kuroda. These partnerships have allowed him to combine ideas and expertise, leading to groundbreaking innovations.

Conclusion

Alvise Gangarossa is a remarkable inventor whose contributions to scanning technology have made a lasting impact. His dedication to innovation and collaboration continues to inspire others in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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