Alton D Romig, Jr

Title: Alton D Romig, Jr: Innovator in Microstructure Control and Chemical Microanalysis

Introduction

Alton D Romig, Jr. is a notable inventor based in Albuquerque, NM (US). He has made significant contributions to the fields of microstructure control and chemical microanalysis. With a total of 2 patents, his work has had a profound impact on the development of advanced materials and analytical techniques.

Latest Patents

Romig's latest patents include innovative processes that enhance the performance of conductive thin films and improve chemical microanalysis instruments. One of his patents focuses on the microstructure control of Al-Cu films for improved electromigration. This process involves forming Al-Cu conductive thin films with reduced electromigration failures, which is particularly useful in the metallization of integrated circuits. The improved formation process includes heat treatment or annealing of the thin film conductor at temperatures ranging from 200°C to 300°C for a duration of 10 minutes to 24 hours under a reducing atmosphere. This method enhances the electromigration behavior of aluminum by hindering aluminum diffusion along the grain boundaries.

Another significant patent is for a normal incidence X-ray mirror designed for chemical microanalysis. This non-planar, focusing mirror is utilized in both electron column instruments and micro-x-ray fluorescence instruments. It comprises a concave, generally spherical base substrate with alternating layers of high and low atomic number materials. The mirror collects and focuses x-rays emitted from a sample, allowing for precise chemical analysis.

Career Highlights

Romig's career is marked by his dedication to advancing technology in the fields of materials science and analytical chemistry. His innovative approaches have led to the development of processes and instruments that enhance the capabilities of existing technologies. His work has been recognized for its potential to improve the reliability and efficiency of electronic devices.

Collaborations

Throughout his career, Romig has collaborated with esteemed colleagues, including Darrel Richard Frear and Joseph R Michael. These collaborations have fostered an environment of innovation and have contributed to the successful development of his patents.

Conclusion

Alton D Romig, Jr. is a distinguished inventor whose work in microstructure control and chemical microanalysis has made a lasting impact on technology. His patents reflect a commitment to innovation and excellence in his field.