Company Filing History:
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Title: Alok Kanti Deb: Innovator in State Estimation and Control Systems
Introduction
Alok Kanti Deb, a distinguished inventor located in Kolkata, India, has made significant contributions in the realm of sensor data processing. With one patented innovation to his name, he has demonstrated expertise in improving the efficiency of system diagnostics and control through advanced sampling techniques.
Latest Patents
Alok Kanti Deb holds a patent titled "State estimation, diagnosis and control using equivalent time sampling." This innovative method and system leverage Equivalent Time Sampling to enhance the effective sampling rate of sensor data, addressing the challenges faced when existing sensor data is insufficient for accurate parameter characterization. By reconstructing high-resolution data sets from the original samples, the patent allows for improved system performance simulation and provides precise estimations for both measured and unmeasured quantities. This output is crucial for fault diagnosis and the control of various systems.
Career Highlights
Throughout his career, Alok Kanti Deb has worked with reputable organizations such as Gm Global Technology Operations LLC and the Indian Institute of Technology Kharagpur. His tenure in these institutions has equipped him with extensive experience in sensor technology and control systems, furthering his capability as an inventor.
Collaborations
Alok has collaborated with several talented professionals in his field, including Soumen De and Pattada A Kallappa. These collaborations have contributed to the development of innovative solutions and enhanced research in estimation and control methodologies.
Conclusion
Alok Kanti Deb's work exemplifies the intersection of innovation and practical application in sensor technology. His unique patent not only advances the capabilities within the field but also showcases his commitment to enhancing system diagnostics and control. As he continues his journey, the impact of his contributions will undoubtedly influence future advancements in this critical area of technology.