The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
May. 10, 2011
Soumen DE, Bangalore, IN;
Pattada A. Kallappa, Bangalore, IN;
Pulak Bandyopadhyay, Rochester Hills, MI (US);
Siddhartha Mukhopadhyay, Kolkata, IN;
Somnath Sengupta, Kolkata, IN;
Alok Kanti Deb, Kolkata, IN;
Soumen De, Bangalore, IN;
Pattada A. Kallappa, Bangalore, IN;
Pulak Bandyopadhyay, Rochester Hills, MI (US);
Siddhartha Mukhopadhyay, Kolkata, IN;
Somnath Sengupta, Kolkata, IN;
Alok Kanti Deb, Kolkata, IN;
GM Global Technology Operations LLC, Detroit, MI (US);
Indian Institute of Technology Kharagpur, Kharagpur, IN;
Abstract
A method and system for using Equivalent Time Sampling to improve the effective sampling rate of sensor data, and using the improved-resolution data for diagnosis and control. Data samples from existing sensors are provided, where the sampling rate of the existing sensors is not sufficient to accurately characterize the parameters being measured. High-resolution data sets are reconstructed using Equivalent Time Sampling. High-resolution input data sets are used in a system model to simulate the performance of the system being measured. Results from the system model, and high-resolution output data sets from Equivalent Time Sampling, are provided to an estimator, which provides accurate estimation of measured quantities and estimation of quantities not measured. Output from the estimator is used for fault diagnosis and control of the system being measured.