Palling, Germany

Alois Bartlechner


 

Average Co-Inventor Count = 3.8

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2022-2024

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4 patents (USPTO):Explore Patents

Title: Alois Bartlechner: Innovator in Position Measurement Technology

Introduction

Alois Bartlechner is a notable inventor based in Palling, Germany. He has made significant contributions to the field of position measurement technology, holding a total of 4 patents. His work focuses on developing devices and methods that enhance the precision and efficiency of measuring contact between tools and workpieces.

Latest Patents

Bartlechner's latest patents include a device and method for determining contact between a tool and a workpiece. This innovative device features a measuring arrangement with a measuring scale that is rotationally fixed to a shaft. It also includes a position encoder that scans the measuring scale to generate position values, which are then processed to determine contact between the tool and the workpiece. Another significant patent is a position-measuring device that consists of a carrier body with first and second measuring graduations and a reference mark. This device utilizes multiple scanners to generate scanning signals and reference pulses, allowing for precise position measurement.

Career Highlights

Alois Bartlechner is currently employed at Dr. Johannes Heidenhain GmbH, a company renowned for its advancements in measurement and control technology. His work at this organization has allowed him to further develop his innovative ideas and contribute to the industry.

Collaborations

Throughout his career, Bartlechner has collaborated with talented individuals such as Sebastian Gruber and Johann Mitterreiter. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Alois Bartlechner's contributions to position measurement technology exemplify his dedication to innovation and precision. His patents reflect a commitment to enhancing the capabilities of measurement devices, making a lasting impact in the field.

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