Winchester, MA, United States of America

Alma J Padilla

This inventor holds 1 USPTO granted patent. Top assignee: Polaroid Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alma J Padilla. Retrieved from https://idiyas.com/inventor/alma-j-padilla

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Alma J Padilla: Innovator in Thermographic Technology

Introduction

Alma J Padilla is a notable inventor based in Winchester, MA (US). He has made significant contributions to the field of thermographic technology, particularly through his innovative patent.

Latest Patents

Padilla holds a patent for a "Thermographic overcoat layer and thermographic image recording members." This invention describes a protective overcoat material that comprises from about 40 weight percent to about 85 weight percent of poly(methyl methacrylate) with a glass transition temperature (Tg) above about 100°C. Additionally, it includes from about 10 weight percent to about 50 weight percent of poly(ethyl methacrylate) with a Tg ranging from about 52°C to about 65°C, along with about 1 weight percent of a melt flow modifier. The patent also details thermal image recording members that incorporate this protective overcoat layer.

Career Highlights

Alma J Padilla is associated with Polaroid Corporation, where he has been able to apply his expertise in thermographic technology. His work has contributed to advancements in imaging and recording technologies.

Collaborations

Padilla has collaborated with notable coworkers, including John M Hardin and Fariza B Hasan, who have also contributed to the field of thermographic technology.

Conclusion

Alma J Padilla's innovative work in thermographic technology exemplifies the impact of dedicated inventors in advancing imaging solutions. His patent reflects a significant step forward in the development of protective materials for thermal imaging applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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