Allan Calamoneri

Title: **Allan Calamoneri: Innovator in Wafer-Level Testing**

Introduction

Allan Calamoneri, located in Danville, CA, is an accomplished inventor known for his innovative contributions to the field of semiconductor testing. With a dedicated focus on enhancing the efficiency and reliability of circuit testing, he has made significant strides in wafer-level burn-in techniques.

Latest Patents

Allan holds a patent for a groundbreaking method and system for wafer-level burn-in testing of circuits. His invention features a unique flip-jumper that allows for the selective connection of signals to the interconnect sites on the wafer. This innovation ensures that these sites maintain consistent electrical communication with the circuit, thereby improving the accuracy and reliability of the testing process.

Career Highlights

Currently, Allan is employed at Alpine Microsystems, Inc., where he plays a vital role in advancing the company’s testing methodologies. His expertise is instrumental in developing solutions that meet the fast-evolving demands of the semiconductor industry. The impact of Allan’s work is recognized within the engineering and research communities, marking him as a pivotal figure in modern electronic testing.

Collaborations

Throughout his career, Allan has collaborated with notable professionals such as Andrew K Wiggin and Martin P Goetz. These partnerships have fostered innovation and facilitated knowledge sharing, further enhancing the research and development initiatives at Alpine Microsystems.

Conclusion

Allan Calamoneri’s contributions to wafer-level burn-in testing exemplify the spirit of innovation that drives the industry forward. His commitment to improving testing processes not only benefits his company but also advances the broader field of semiconductor technology. As he continues his work, Allan remains a prominent figure among inventors dedicated to shaping the future of electronics.