Bartlett, IL, United States of America

Allan C Ahrens

This inventor holds 2 USPTO granted patents. Top assignee: Chaney Instrument Co.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Allan C Ahrens. Retrieved from https://idiyas.com/inventor/allan-c-ahrens

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2003

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2 patents (USPTO):Explore Patents

Title: The Innovations of Allan C. Ahrens

Introduction

Allan C. Ahrens is a notable inventor based in Bartlett, Illinois. He has made significant contributions to the field of thermometry, holding two patents that showcase his innovative spirit. His work is particularly recognized in the development of specialized thermometers.

Latest Patents

Ahrens' latest patents include the "Ladle Thermometer" and the "Spoon Thermometer." These inventions reflect his commitment to enhancing culinary tools, providing more accurate temperature readings for cooking and food preparation.

Career Highlights

Allan C. Ahrens is associated with Chaney Instrument Company, where he applies his expertise in instrument design and innovation. His role at the company has allowed him to contribute to the development of practical and user-friendly products.

Collaborations

Throughout his career, Ahrens has collaborated with talented individuals such as Patrick J. Devlin and Patricia A. Nielsen. These partnerships have fostered a creative environment that encourages the exchange of ideas and innovation.

Conclusion

Allan C. Ahrens exemplifies the spirit of innovation through his patents and contributions to the field of thermometry. His work continues to impact the culinary world, making cooking more precise and enjoyable.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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