This inventor holds 1 USPTO granted patent. Top assignee: Rockley Photonics Limited. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Alison Perrott: Innovator in Optoelectronic Device Testing
Introduction
Alison Perrott is a notable inventor based in Cork, Ireland. She has made significant contributions to the field of optoelectronics, particularly in the testing of optoelectronic devices. Her innovative approach has led to the development of a unique method that enhances the efficiency and accuracy of device testing.
Latest Patents
Alison holds a patent for a "Method of testing, wafer, and testing station." This patent describes a method for testing one or more optoelectronic devices located on respective device coupons present on a wafer. The method involves testing the optoelectronic devices using corresponding testing elements located on the same wafer. The testing can be conducted through two protocols: one that operates the device to produce an optical output and detects the light incident on the testing element, and another that allows the optoelectronic device to detect light received from the testing element.
Career Highlights
Alison Perrott is currently employed at Rockley Photonics Limited, where she continues to advance her research and development efforts in optoelectronics. Her work has been instrumental in improving testing methodologies, which are crucial for the performance and reliability of optoelectronic devices.
Collaborations
Alison collaborates with talented professionals in her field, including Ludovic Caro and Mohamad Dernaika. These partnerships enhance her research and contribute to the innovative solutions being developed at Rockley Photonics Limited.
Conclusion
Alison Perrott is a pioneering inventor whose work in optoelectronic device testing is making a significant impact in the industry. Her patent and ongoing contributions reflect her commitment to innovation and excellence in her field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
