Bologna, Italy

Ali Al-Erwi

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Datalogic IP Tech S.r.l.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ali Al-Erwi. Retrieved from https://idiyas.com/inventor/ali-al-erwi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Biography of Inventor Ali Al-Erwi

Introduction: Ali Al-Erwi is an innovative inventor based in Bologna, Italy. He has made significant contributions to the field of imaging systems, particularly through his work with event-based sensors.

Latest Patents: Ali holds a patent for "Imaging systems with enhanced functionalities with event-based sensors." This patent encompasses imaging systems that utilize event-based sensors for various applications, including conveyor systems, mass flow detection systems, machine vision systems, and retail settings. The technology allows for the integration of event-based sensors with frame-based cameras to enhance the functionality of imaging systems.

Career Highlights: Ali Al-Erwi is currently employed at Datalogic IP Tech S.r.l., where he continues to develop and refine his innovative ideas. His work has positioned him as a key player in the advancement of imaging technology.

Collaborations: Throughout his career, Ali has collaborated with notable colleagues, including Federico Canini and Francesco D'Ercoli. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion: Ali Al-Erwi's contributions to the field of imaging systems demonstrate his commitment to innovation and excellence. His work with event-based sensors is paving the way for new applications and advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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