This inventor holds 3 USPTO granted patents, plus 1 CIPO patent. Top assignee: Troxler Electronic Laboratories, Inc.. Active years: 1993-2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1993-2002
Title: Innovations of Alfred W. Jordan
Introduction
Alfred W. Jordan is a notable inventor based in Raleigh, NC, recognized for his contributions to the field of nuclear density gauging. With a total of three patents to his name, he has made significant advancements in measurement technology that enhance precision and reliability.
Latest Patents
One of his latest inventions is the thin layer nuclear density gauge. This innovative device features a gauge housing with a vertical cavity and a base. It includes two radiation detectors positioned adjacent to the base, a vertically moveable source rod, and a radiation source at the distal end of the rod. The design allows for precise control of the source rod's position, with a maximum radial movement of less than about 0.003 inches at each predetermined position. Additionally, the gauge incorporates an improved radiation shield assembly that enhances its functionality and safety.
Career Highlights
Alfred W. Jordan has spent a significant portion of his career at Troxler Electronic Laboratories, Inc., where he has been instrumental in developing advanced measurement technologies. His work has contributed to the company's reputation as a leader in the field of nuclear density gauging.
Collaborations
Throughout his career, Alfred has collaborated with notable colleagues, including Robert Ernest Troxler and Wewage H. L. Dep. These partnerships have fostered innovation and have led to the successful development of various technologies in the industry.
Conclusion
Alfred W. Jordan's contributions to the field of nuclear density gauging through his innovative patents and collaborations highlight his importance as an inventor. His work continues to influence measurement technology, ensuring accuracy and reliability in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
