Maxhuette-Haidhof, Germany

Alfred Lell

This inventor holds 1 USPTO granted patent. Top assignee: Ams-Osram International Gmbh. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alfred Lell. Retrieved from https://idiyas.com/inventor/alfred-lell-tbdykzif

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Alfred Lell

Introduction

Alfred Lell is a notable inventor based in Maxhuette-Haidhof, Germany. He has made significant contributions to the field of radiation-emitting devices. His work is characterized by a focus on advanced laser technology and its applications.

Latest Patents

Alfred Lell holds 1 patent for a radiation-emitting device. This device features a laser bar designed to emit laser radiation. It includes a waveguide with a core, cladding, an entry face, and an exit face. The design incorporates a heat sink that supports the waveguide, ensuring efficient operation. During use, the laser radiation enters the waveguide and is guided through the core, where it can be converted into secondary radiation.

Career Highlights

Alfred Lell is currently employed at Ams-Osram International GmbH, a company known for its innovations in lighting and sensor technology. His role involves developing cutting-edge solutions that enhance the performance of radiation-emitting devices.

Collaborations

Throughout his career, Alfred has collaborated with talented individuals such as Muhammad Ali and Harald Koenig. These partnerships have contributed to the advancement of technology in their respective fields.

Conclusion

Alfred Lell's work exemplifies the spirit of innovation in the realm of laser technology. His contributions continue to influence the development of advanced radiation-emitting devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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