Hedemora, Sweden

Alf Brodin

This inventor holds 1 USPTO granted patent. Top assignee: Abb Technology Ag. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alf Brodin. Retrieved from https://idiyas.com/inventor/alf-brodin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Alf Brodin

Introduction

Alf Brodin is a notable inventor based in Hedemora, Sweden. He has made significant contributions to the field of capacitance measurement through his innovative patent. His work exemplifies the intersection of technology and practical applications in electronic measurement.

Latest Patents

Alf Brodin holds a patent for a "Method, capacitance meter, computer program and computer program product for improved capacitance measurement." This invention describes a method for measuring capacitance using a capacitance meter that includes an AC power source with a controllable frequency. The capacitance meter performs measurements at different frequencies based on the initial readings, allowing for more accurate capacitance assessments.

Career Highlights

Brodin is associated with Abb Technology AG, where he applies his expertise in developing advanced measurement technologies. His innovative approach has led to the creation of a capacitance meter that enhances the accuracy of capacitance measurements, making it a valuable tool in various electronic applications.

Collaborations

Alf Brodin has worked alongside talented colleagues such as Jon Lissmats and Jerry Svedlund. Their collaborative efforts contribute to the advancement of technology in their field.

Conclusion

Alf Brodin's contributions to capacitance measurement technology highlight his innovative spirit and dedication to improving electronic measurement methods. His patent reflects a significant advancement in the field, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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