This inventor holds 1 USPTO granted patent. Top assignee: Nanosys, Inc.. Active years: 2019.
Company Filing History:
Years Active: 2019
Title: Alexander Puski: Innovator in Optical Measurement Technology
Introduction
Alexander Puski is a notable inventor based in Los Gatos, CA (US). He has made significant contributions to the field of optical measurement, particularly in the measurement of thin films. His innovative work has led to the development of a patented technology that enhances the understanding of optical properties in various applications.
Latest Patents
Puski holds a patent for "Optical measurement of thin films." This patent describes embodiments of a measurement apparatus designed for measuring the optical properties of a sample film. The apparatus includes a first stage with an optical source and a block of transparent material that supports the sample film. The second stage features multiple layers and an optical detector, while an arm structure allows for the translation of the second stage with respect to the first stage. This invention represents a significant advancement in optical measurement technology.
Career Highlights
Alexander Puski is currently associated with Nanosys, Inc., where he continues to work on innovative technologies. His career is marked by a commitment to advancing optical measurement techniques and contributing to the scientific community.
Collaborations
Puski has collaborated with notable colleagues, including Robert E. Wilson and Ernest Lee. These collaborations have further enriched his work and contributed to the development of cutting-edge technologies in the field.
Conclusion
In summary, Alexander Puski is a distinguished inventor whose work in optical measurement has led to valuable advancements in the understanding of thin films. His contributions continue to impact the field positively.