Company Filing History:
Years Active: 2006
Title: Alexander Artjomov: Innovator in Semiconductor Metrology
Introduction
Alexander Artjomov is a prominent inventor based in Moscow, Russia. He has made significant contributions to the field of semiconductor metrology, particularly in the measurement of thin dielectric layers on semiconductor wafers. His innovative approach has the potential to enhance the accuracy and efficiency of semiconductor manufacturing processes.
Latest Patents
Artjomov holds a patent for an "Apparatus for measuring of thin dielectric layer properties on semiconductor wafers with contact self-aligning electrodes." This invention relates to the metrology of thin dielectric layers on semiconductor wafers, focusing on the interfaces of dielectric layers to wafer substrates and the properties of semiconductor wafers. The invention allows for the measurement of metrology data for thin dielectric layers on semiconductor wafers electrically, utilizing contact electrodes that align their contact surface to the wafer surface locally at the measurement sites. He has 1 patent to his name.
Career Highlights
Artjomov is associated with Ahbee 2, L.P., a California Limited Partnership, where he continues to develop innovative solutions in semiconductor technology. His work has been instrumental in advancing the field of metrology, providing valuable insights into the properties of semiconductor materials.
Collaborations
Artjomov has collaborated with notable professionals in his field, including Vitali Souchkov and Vladimir Faifer. These collaborations have further enriched his research and development efforts, leading to advancements in semiconductor metrology.
Conclusion
Alexander Artjomov is a key figure in the field of semiconductor metrology, with a focus on innovative measurement techniques for thin dielectric layers. His contributions are paving the way for advancements in semiconductor technology and manufacturing processes.