Alex Caviness

Title: Alex Caviness: Innovator in Structured Light Metrology

Introduction

Alex Caviness is a notable inventor based in Oakland, CA. He has made significant contributions to the field of structured light metrology, showcasing his expertise through his innovative patent. His work focuses on enhancing the efficiency and accuracy of scanning objects using advanced technology.

Latest Patents

Caviness holds a patent titled "Optimal parameter selection for structured light metrology." This patent describes a method for selecting an optimal value for an adjustable parameter in a structured light metrology (SLM) system. The SLM system conducts test scans of an object to gather multiple sets of measurements, each utilizing a different parameter value. By calculating a quality metric for each test scan based on the measurements and simulation data, Caviness's method identifies the test scan that meets a specified optimization criterion. The adjustable parameter value from this identified test scan is then selected as the optimal value for future scans of the object.

Career Highlights

Caviness is currently employed at Lawrence Livermore National Security, LLC, where he applies his skills and knowledge in metrology. His work contributes to advancements in technology and research, particularly in the field of structured light systems.

Collaborations

Throughout his career, Caviness has collaborated with talented individuals such as Brian Giera and Adam W Jaycox. These collaborations have fostered innovation and have led to significant advancements in their respective fields.

Conclusion

Alex Caviness is a distinguished inventor whose work in structured light metrology has paved the way for improved scanning techniques. His patent reflects his commitment to innovation and excellence in technology.