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For the Inventor, By the Inventor

Mountain View, CA, United States of America

Alex Bratkovski

This inventor holds 5 USPTO granted patents. Top assignee: Hewlett-Packard Development Company, L.p.. Active years: 2007-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alex Bratkovski. Retrieved from https://idiyas.com/inventor/alex-bratkovski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 5

% Patents Active = 60.0

Average Co-Inventor Count = 3.3

ph-index = 4

Forward Citations = 62(Granted Patents)


Location History:

  • Mountain View, CA (US) (2007 - 2010)
  • Palo Alto, CA (US) (2008 - 2010)

Company Filing History:

goldMedal5 out of 27,691 
 
Hewlett-Packard Development Company, L.p.
 patents

Years Active: 2007-2010

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5 patents (USPTO):Explore Patents
1. 7763973 - Integrated heat sink for a microchip (2010-07-27),
2. 7711213 - Nanowire-based modulators (2010-05-04),
3. 7492979 - Photonic crystal laser sensors and methods (2009-02-17),
4. 7429125 - System and method for cantilever based calorimetric analysis (2008-09-30),
5. 7289221 - Mach Zehnder photonic crystal sensors and methods (2007-10-30),

Title: Top Inventor in Mountain View

Introduction

Jennifer L. Hillman is a prominent inventor based in Mountain View, California. Notably, he has made significant contributions to various fields through his innovative work.

Latest Patents

His recent patents include advancements in technology and engineering, showcasing his expertise and creativity.

Career Highlights

Throughout his career, Hillman has achieved numerous accolades and recognition for his groundbreaking inventions.

Collaborations

He has collaborated with several leading companies and research institutions, further enhancing his impact on the industry.

Conclusion

Jennifer L. Hillman's contributions to innovation continue to inspire and influence the technological landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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