Hefei, China

Alei Liu

This inventor holds 1 USPTO granted patent. Top assignee: Hefei Visionox Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alei Liu. Retrieved from https://idiyas.com/inventor/alei-liu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Alei Liu: Innovator in Image Acquisition Technology

Introduction

Alei Liu is a prominent inventor based in Hefei, China. He has made significant contributions to the field of image acquisition technology. His innovative approach has led to the development of a unique method that enhances the way images are captured and processed.

Latest Patents

Alei Liu holds a patent for an "Image acquisition method and system, and display panel." This invention involves acquiring N images of an object using N shooting devices, each with different fields of view. The method ensures that the N images correspond one-to-one with the shooting devices. Feature extraction is performed on these images to obtain M features, where M is an integer multiple of N. This innovative approach includes various types of features, enhancing the overall image acquisition process. He has 1 patent to his name.

Career Highlights

Alei Liu is currently employed at Hefei Visionox Technology Co., Ltd., where he continues to push the boundaries of technology. His work focuses on improving image acquisition systems, which are crucial for various applications in modern technology.

Collaborations

Alei Liu collaborates with talented individuals such as Dandan Sun and Lei An. Their combined expertise contributes to the innovative projects at Hefei Visionox Technology Co., Ltd.

Conclusion

Alei Liu's contributions to image acquisition technology exemplify the spirit of innovation. His work not only advances the field but also sets a foundation for future developments in imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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