Azzano Decimo, Italy

Aldo Facchin

USPTO Granted Patents = 2 


 

Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2016-2024

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2 patents (USPTO):Explore Patents

Title: Aldo Facchin: Innovator in Image Enhancement Technologies

Introduction

Aldo Facchin is a notable inventor based in Azzano Decimo, Italy. He has made significant contributions to the field of image enhancement, particularly for metrological applications. With a total of 2 patents, his work showcases innovative methods that improve the quality and accuracy of image processing.

Latest Patents

One of Aldo's latest patents is focused on dark image enhancement. This invention relates to a method for enhancing images specifically for metrological applications. The method involves providing a geometric correction image that has a higher geometric correctness than the processed image. It also includes steps to reduce the loss of initial metrological information by fusing the enhanced image with the geometric correction image.

Another significant patent is the point cloud assisted photogrammetric rendering method and apparatus. This method describes a process for photogrammetric restitution that utilizes point cloud data to improve the accuracy and efficiency of image rendering.

Career Highlights

Aldo Facchin is currently associated with Leica Geosystems AG, a company renowned for its advanced measurement and imaging technologies. His work at Leica has allowed him to push the boundaries of image enhancement techniques, contributing to the company's reputation for innovation in the field.

Collaborations

Throughout his career, Aldo has collaborated with esteemed colleagues such as Mario Nadalin and Bernhard Metzler. These collaborations have fostered a creative environment that has led to the development of cutting-edge technologies in image processing.

Conclusion

Aldo Facchin's contributions to image enhancement technologies reflect his dedication to innovation and excellence. His patents not only advance the field of metrology but also demonstrate the potential for future developments in image processing.

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