San Diego, CA, United States of America

Albert Nguyen

This inventor holds 1 USPTO granted patent. Top assignee: Qualcomm Incorporated. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Albert Nguyen. Retrieved from https://idiyas.com/inventor/albert-nguyen-w9arof7h

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2013

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations by Albert Nguyen in Wireless Device Monitoring

Introduction

Albert Nguyen is an accomplished inventor based in San Diego, CA. He has made significant contributions to the field of wireless communication technology. His innovative work focuses on systems and methods for monitoring parameters of wireless devices.

Latest Patents

Nguyen holds a patent for "Systems and methods for monitoring parameters of a wireless device." This patent describes systems and methods for controlling monitoring operations, such as monitoring signal strength and various overhead information data in battery-powered mobile communication devices. The invention allows for the monitoring of user interface status and flow status, enabling a determination of when and how often monitoring should be performed.

Career Highlights

Albert Nguyen is currently employed at Qualcomm Incorporated, a leading company in wireless technology. His work at Qualcomm has allowed him to develop and refine his innovative ideas in the field of communication devices.

Collaborations

Nguyen has collaborated with notable colleagues, including Adam A Mudrick and Siddharth Jayaraman. These collaborations have contributed to the advancement of technology in wireless communications.

Conclusion

Albert Nguyen's contributions to wireless device monitoring exemplify the innovative spirit of modern inventors. His patent and work at Qualcomm highlight the importance of continuous advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…