Stanford, CA, United States of America

Albert Chiou

This inventor holds 1 USPTO granted patent. Top assignee: Leland Stanford Junior University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Albert Chiou. Retrieved from https://idiyas.com/inventor/albert-chiou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Albert Chiou: Innovator in Clinical Image Quality Assessment

Introduction

Albert Chiou is an accomplished inventor based in Stanford, California. He has made significant contributions to the field of clinical image quality assessment. His innovative work focuses on enhancing the quality of clinical images through automated systems and methods.

Latest Patents

Chiou holds a patent for "Systems and methods for automated clinical image quality assessment." This patent describes various embodiments that provide instructions and feedback for clinically relevant image quality. The methods outlined in his patent also include generating a model to assess image quality effectively.

Career Highlights

Chiou is affiliated with Leland Stanford Junior University, where he continues to advance research in clinical imaging. His work is pivotal in improving the standards of image quality in clinical settings, which can lead to better patient outcomes.

Collaborations

Chiou has collaborated with notable colleagues, including Roxana Daneshjou and Kailas Vodrahalli. These partnerships enhance the research and development of innovative solutions in the medical imaging field.

Conclusion

Albert Chiou's contributions to automated clinical image quality assessment demonstrate his commitment to improving healthcare technology. His patent and ongoing work at Leland Stanford Junior University highlight the importance of innovation in clinical practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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