Alastair N Couper

Title: Alastair N Couper: Innovator in Microprocessor Testing Technology

Introduction

Alastair N Couper is a notable inventor based in Honolulu, HI (US). He has made significant contributions to the field of electronic assembly testing, particularly through his innovative patent. His work focuses on enhancing the functionality and troubleshooting capabilities of microprocessor-based systems.

Latest Patents

Alastair N Couper holds a patent for a "Test apparatus for electronic assemblies employing a microprocessor." This invention presents a test system designed for functionally testing and troubleshooting microprocessor-based systems and assemblies. The test system is connected in place of the microprocessor circuit of the unit being tested (UUT). It includes a microprocessor circuit that is supplied with the UUT clock signal, which is the same type of microprocessor circuit utilized by the UUT. The system periodically switches this microprocessor into signal communication with the UUT for a single UUT bus cycle to perform read or write operations. Various test sequences are provided for testing the UUT bus, RAM, ROM, and write-responsive I/O registers.

Career Highlights

Alastair N Couper is associated with John Fluke Manufacturing Company, Inc., where he has contributed to advancements in testing technology. His innovative approach has led to the development of systems that can derive memory maps and test parameters without prior knowledge of the UUT operational sequence. This capability enhances the efficiency and effectiveness of testing procedures in electronic assemblies.

Collaborations

Throughout his career, Alastair has collaborated with notable colleagues, including Kasi S Bhaskar and Alden J Carlson. These collaborations have fostered an environment of innovation and have contributed to the development of advanced testing solutions.

Conclusion

Alastair N Couper's contributions to microprocessor testing technology exemplify the impact of innovation in the field of electronics. His patent reflects a deep understanding of the complexities involved in testing microprocessor-based systems, showcasing his expertise and commitment to advancing technology.