Dunblane, United Kingdom

Alan James Duncan

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Corporation. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alan James Duncan. Retrieved from https://idiyas.com/inventor/alan-james-duncan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Alan James Duncan: Innovator in Optical Technology

Introduction

Alan James Duncan is a notable inventor based in Dunblane, GB. He has made significant contributions to the field of optical technology, particularly through his innovative patent work. His expertise and creativity have led to advancements that benefit various industries.

Latest Patents

Alan holds a patent for a Fourier transform spectrometer utilizing a birefringent optical component. This invention showcases his ability to merge complex scientific principles with practical applications, enhancing the capabilities of spectrometry.

Career Highlights

Alan is currently employed at Siemens Corporation, where he continues to push the boundaries of technology. His work at Siemens has allowed him to collaborate with other talented professionals in the field, furthering his impact on optical innovations.

Collaborations

Some of his notable coworkers include John Miles Padgett and Wilson Sibbett. Their collective expertise contributes to a dynamic work environment that fosters innovation and creativity.

Conclusion

Alan James Duncan is a distinguished inventor whose work in optical technology exemplifies the spirit of innovation. His contributions, particularly in the realm of spectrometry, highlight the importance of creativity in advancing scientific understanding and practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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