This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: University of Galway, Other. Active years: 2011-2013.
Company Filing History:
1 out of 84 
1 out of 834,350 Years Active: 2011-2013
Title: Alan George Ryder: Innovator in Spectroscopic Data Analysis
Introduction
Alan George Ryder is a notable inventor based in Galway, Ireland. He has made significant contributions to the field of spectroscopic data analysis, holding 2 patents that showcase his innovative methods for classifying materials and chemicals.
Latest Patents
Ryder's latest patents include a kernel-based method and apparatus for classifying materials or chemicals and for quantifying the properties of materials or chemicals in mixtures using spectroscopic data. This method determines the similarity of a first spectrum and a second spectrum, each representing a result of spectral analysis. The kernel function calculates the similarity by comparing spectral attributes within a defined window, allowing for the classification of unknown spectra and the prediction of analyte concentrations in mixtures. Another significant patent is the similarity index, a rapid classification method for multivariate data arrays. This method assesses the similarity between two multivariate data sets, particularly in fluorescence spectroscopy for quality control analysis.
Career Highlights
Throughout his career, Alan has worked with the National University of Ireland, Galway, where he has contributed to research and development in his field. His work has been instrumental in advancing the understanding of spectroscopic data analysis.
Collaborations
Alan has collaborated with notable colleagues such as Tom Howley and Michael Gerard Madden, enhancing the impact of his research through teamwork and shared expertise.
Conclusion
Alan George Ryder's innovative approaches to spectroscopic data analysis have established him as a key figure in his field. His patents reflect a commitment to advancing technology and improving methods for material classification and analysis.