Alan David Dorundo

Title: Alan David Dorundo: Innovator in Optical Defect Analysis

Introduction

Alan David Dorundo is a talented inventor based in Boca Raton, FL, with a remarkable contribution to the field of optical apparatuses. He holds two patents that showcase his innovations aimed at enhancing surface analysis of materials. His work significantly contributes to advancing defect detection technologies.

Latest Patents

Alan Dorundo's latest patents include the "Optical apparatus for rapid defect analysis" and "Apparatus and method for storing interferometric images of scanned." The first patent describes an apparatus for inspecting the surface of a sample. This device utilizes a wide scanning interferometer to locate defects or anomalies and a narrow scanning interferometer to develop profiles of individual defects. The approach allows the sample to be rotated about an axis while the interferometers are moved radially, increasing the accuracy of defect identification.

In his second patent, an interferometer is employed to locate and examine defects on a test surface. The test specimen is driven past the objective of the interferometer at a constant speed, capturing darkfield interferograms for analysis. Defect locations are recorded, and subsequent static measurements are conducted, utilizing an area array of CCD elements. This innovative method enables accurate height calculations for surface segments, correcting for height discrepancies in specific transition boundaries.

Career Highlights

Alan is a key contributor at the International Business Machines Corporation (IBM), where he focuses on developing cutting-edge optical technologies. His role involves applying his extensive knowledge in the field to enhance IBM’s capabilities in defect analysis and inspection technologies.

Collaborations

Throughout his career, Alan has had the opportunity to collaborate with talented coworkers such as Michael G. Lisanke and Huizong Lu. Together, they have worked on various projects related to optical inspection methods, combining their expertise to push the boundaries of what is possible in material analysis.

Conclusion

Alan David Dorundo stands out as an innovator in the optical technology sector, particularly in defect detection and analysis. His patents have laid the groundwork for advancements in inspecting and understanding material surfaces, showcasing his profound impact on the industry. As he continues to work with esteemed colleagues at IBM, further innovations are anticipated from this talented inventor.