Cedar Falls, IA, United States of America

Alan Alfred Larson

This inventor holds 1 USPTO granted patent. Top assignee: Deere & Company. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alan Alfred Larson. Retrieved from https://idiyas.com/inventor/alan-alfred-larson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 60(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Alan Alfred Larson - Innovator in Depth Control Implementation

Introduction

Alan Alfred Larson is a distinguished inventor based in Cedar Falls, Iowa, known for his innovative contributions to the agricultural machinery industry. His most notable patent addresses the implementation of depth control and display, showcasing his commitment to enhancing farming technology.

Latest Patents

Alan holds a singular patent focused on implementing depth control and display. This invention aims to improve the precision and efficiency of agricultural equipment, ultimately aiding farmers in their operations.

Career Highlights

Alan is currently employed at Deere & Company, a leading firm in the agricultural machinery sector. His work at Deere & Company reflects his dedication to advancing technologies that benefit the agricultural community.

Collaborations

Throughout his career, Alan has collaborated with notable professionals, including James Thomas Noonan and Shane Julius Brueggen. These partnerships have contributed to the development of innovative solutions within the company.

Conclusion

Alan Alfred Larson's contributions through his patent and collaboration efforts underscore the importance of innovation in agriculture. His work at Deere & Company continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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