Paris, France

Alain Petit

This inventor holds 1 USPTO granted patent. Top assignee: Commissariat a L'energie Atomique Et Aux Energies Alternatives. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alain Petit. Retrieved from https://idiyas.com/inventor/alain-petit-gryb83kv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: The Innovations of Alain Petit

Introduction

Alain Petit is a notable inventor based in Paris, France. He has made significant contributions to the field of isotopic analysis, particularly through his innovative processes. His work is recognized for its impact on scientific research and applications.

Latest Patents

Alain Petit holds a patent for an isotopic analysis process by optical emission spectrometry. This patent showcases his expertise and dedication to advancing analytical techniques in his field. He has 1 patent to his name, reflecting his innovative contributions.

Career Highlights

Alain Petit is associated with the Commissariat à l'Énergie Atomique et aux Énergies Alternatives. This prestigious organization focuses on research and development in energy and nuclear technology. His role there has allowed him to work on cutting-edge projects that push the boundaries of scientific understanding.

Collaborations

Alain Petit has collaborated with esteemed colleagues such as Patrick Mauchien and Walter Pietsch. These partnerships have fostered a collaborative environment that enhances the quality and impact of their research.

Conclusion

Alain Petit is a distinguished inventor whose work in isotopic analysis has made a significant mark in the scientific community. His contributions continue to influence research and innovation in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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